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Updated Automatic Transformer Test System TH2840 Series

Updated Automatic Transformer Test System TH2840 Series

(Summary description)The industry’s fastest test speed, the industry’s highest test level, the industry’s highest bias voltage, and the industry’s most user-friendly experience.

Updated Automatic Transformer Test System TH2840 Series

(Summary description)The industry’s fastest test speed, the industry’s highest test level, the industry’s highest bias voltage, and the industry’s most user-friendly experience.

  • Categories:New Arrival
  • Time of issue:2021-08-19 11:06
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Information

Automatic Transformer Test System TH2840

The industry’s fastest test speed, the industry’s highest test level, the industry’s highest bias voltage, and the industry’s most user-friendly experience.

 

Introduction of Innovation

1 LCR test parameters changed from the original two parameters to 4 parameter displays; combined LCR measurement display and sorting display;

 

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2 The LCR test incorporates the nominal value and reference value settings, making it easier for customers to understand and use. Cancel the auxiliary file and cancel the secondary parameter file

 

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3 The frequency, level, offset, function, and delay of each point of the list scan can be set independently, which meets the needs of most customers.

 

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4 LCR curve scanning split-screen display.

 

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5 Convenient operation and intuitive display

Handler setting interface

 

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The Handler sorting mode setting of transformer scanning can give a maximum of 30 sorting signal outputs.

 

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6 When setting pins in the past, when you need to connect pins in series and in parallel, you need to enter different sub-pages:

 

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7 The setting of the test condition of the compressor is more concise and convenient. For the relevant parameters of Lx, you need to enter 6-7 different sub-pages:

 

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Now multiple parameters can be switched on one page, and all relevant parameters of Lx can be set in one table:

 

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Cancel the range setting function used in the above picture, and change to the series-parallel equivalent mode of the picture in Article

 

8 Transformer scan: Each scan parameter can be averaged and delayed to increase stability without affecting the test speed of other parameters.

Both the positive and negative terminals of the PS can be input to 12 pins, and the background colour of the selected parameter will be different from other parameters8.

 

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9 Transformer scanning: Multi-pin use 1-6, instead of 1, 2, 3, 4, 5, 6. Simplify the display page, improve the input efficiency.

 

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10 Transformer scan: Each parameter has its own independent series and parallel pin settings, which is more flexible.

 

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11 Pin related page

After a collective discussion by the software designers, the design goals were put forward, and with the assistance of Cui Xiang, the final results were quickly seen, which accelerated the design speed.

The interface adds elements such as pictures, colors, borders, and improves the correlation between the pin settings and the test horns. Users can see it at a glance, without too much explanation, and they will operate when they see the page.

 

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12 The Lk setting saves the input leakage inductance pin, directly input the nominal value at the corresponding pin, and the upper and lower limits are sufficient

 

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13 The balance sweep is changed from 5 to 10 points, and the mode is changed to absolute value switch. According to this switch, whether the final result of the formula is positive and then compare

 

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14. New functions in the transformer number interface A Scan box mode B Internal resistance C Bias source.

 

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15 The transformer scan interface can directly use the positioning scan function and the split screen function.

 

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16 Press the home button to display all interface entries

 

17 Transformer single group test function.

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