TH1991/TH1992 series precision source/measure units can output up to ±210V DC voltage, ±3A DC current and ±10.5A pulse current, minimum 10fA/100nV power supply and measurement resolution, support high-speed sampling, and can generate arbitrary waveforms.

TH1991/TH1992 series precision source/measure unit series adopts 7-inch capacitive touch screen, with Linux operating system as the bottom layer, interactive graphical user interface and various display modes, and built-in diodes, triodes, MOS tubes and IGBTs and other devices. The I/V curve scanning function can complete the IV function test without connecting to the host computer, which can significantly improve the test efficiency.

The TH1991/TH1992 series of precision source/measure units with comprehensive and integrated power and measurement functions are ideal for testing semiconductors, active/passive devices, and a variety of other devices and materials.

The TH1991/TH1992 series of precision source/measure units are widely used in R&D and educational applications, industrial development, testing and manufacturing.  

Features

• 10fA current output and measurement resolution; 100nV voltage output and component resolution

• ±210V maximum voltage output; ±3.03A (DC)/±10.5A (pulse) maximum current output.

• Support DC, pulse, sweep and list output.

• Minimum sampling interval 1μs

• Built-in I/V curve sweep function, time-domain waveform scrolling display function

• The pulse width of the pulse output can be as small as 50μs

• Both two-wire measurement / four-wire measurement

• The output filter time constant (or cutoff frequency) can be freely set to achieve any frequency response output

• 14-level sorting function, including Grading and Sorting modes.

• Math operation function, moving average filter function, deviation subtraction function

• Semiconductor parameter analysis function to quickly generate characteristic curves of commonly used devices.

• Four basic modes of voltage source, current source, voltmeter, ammeter or resistance meter

• Delta low resistance test method, which can effectively compensate the measurement error caused by thermal electromotive force.

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