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Products
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Component Parameter Tester
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Semiconductor C-V Analyzer
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Impedance Analyzer
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Benchtop Type LCR Meter
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Handheld LCR Meter
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DC Bias Current Source
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Automatic Transformer Test system
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Micro Signal Type Tester
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Precision Source Measurement Unit
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Low Noise Precision Power Supply
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DC Resistance Meter
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Insualtion Resisitance Meter
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Battery Tester
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Digit Multimeter
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Power Electronic Tester
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Electrical Safety Tester and Cable Tester
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Multifunction Safety Compliance Analyzer
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Impluse Winding Tester
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Cable / Harness Meter
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Hipot Tester
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Ground Bond Tester
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Accessories
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About Us
CV Characteristic Test and Analysis of MOSFET Devices
Parasitic capacitance generally refers to the capacitance characteristics of inductors, resistors, chip pins, etc. under high frequency conditions. In the case of high frequency, whether it is resistance, capacitance, inductance, or diode, triode, the equivalent capacitance generated by MOS tube will increase and cannot be ignored. The parasitic capacitance of the MOS tube is a dynamic parameter that directly affects its switching performance. Ciss input capacitance, Coss output capacitance, Crss reverse transfer capacitance, and Rg gate series equivalent resistance are important parasitic parameters of power semiconductors, which need to be measured during R&D and manufacturing.
Solution Details,
Testing requirements:
Ciss input capacitance: Short circuit the drain to source, and the capacitance between the gate and source measured with an AC signal is the input capacitance
Coss output capacitance: short the gate source, the capacitance between the drain and source measured with an AC signal is the output capacitance
Crss Reverse Transfer Capacitance: With the source grounded, the measured capacitance between the drain and gate is the reverse transfer capacitance
Rg: The series equivalent resistance between the test gate and the source
At present, the common semiconductor CV characteristic test scheme in the market requires at least one electric bridge, one power supply, one DC bias fixture, one set of matrix switches, one upper computer and related control software. The construction and debugging process is very cumbersome. And the test effect is not stable.
TH510 series semiconductor C-V characteristic analyzer is an analytical instrument developed by Tonghui Electronics for the production and development of semiconductor materials and devices. It adopts an integrated design and displays four parameters at the same time. Only one instrument can meet the rapid sorting and automation of the production line. Integration testing and meeting laboratory development and analysis. The TH510 series has a built-in 1500V high-voltage source with high test accuracy; it can be expanded to 6 channels, which is very important for the modular test requirements of the IGBT industry.

Instruments List,
TH511
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