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High temperature dielectric parameter test

High temperature dielectric parameter test

(Summary description)

High temperature dielectric parameter test

(Summary description)

Information

In the field of new material research, the measurement of high temperature dielectric parameters is a problem that many universities and research institutes often face. Cooperate with Tonghui Electronics and professional high-temperature dielectric system integrators, and use TH2851 impedance analyzer for supporting system integration to meet the needs of customers for high-temperature dielectric measurement and curve analysis.

 

Solution Details,

Test requirements: test impedance value, impedance curve at 50MHz frequency, and dielectric parameter measurement at high temperature of 20-500°C

The TH2851-050 is integrated into the high temperature test system for material "dielectric parameter test" analysis and research. The test speed is fast, the stability is good, and the data acquisition and graphic display are very convenient. It shortens the customer's experiment time and broadens the scope of its material measurement and analysis.

 

Instruments List,
1 set of TH2851-050

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Changzhou Tonghui Electronic Co. Ltd.   苏ICP备XXXXXX号  Powered by: www.300.cn Changzhou tha   tha   tha   tha
Changzhou Tonghui Electronic Co. Ltd.   苏ICP备05016932号-1  Powered by: www.300.cn Changzhou tha